000 00681nam a2200265 a 4500
003 AR-ReUNN
005 20260702155838.0
008 260701s1966 us |||||||||||||||||eng
041 0 _aeng
100 1 _aAnderson, J. C.
_9204277
245 1 4 _aThe use of thin films in physical investigations
264 1 _aNew York
_bAcademic Press
_c1966
300 _a462 páginas
650 4 _aFisica
_99220
650 4 _aMetal
_918097
650 4 _aDeposicion
_9204278
650 4 _aElectronica
_9424
650 4 _aEvaporacion
_91919
650 4 _aMedida
_9200052
650 4 _aFilms
_9204279
650 4 _aDelgados
_9204280
942 _cLIB
035 _a(EXA)18109
001 270724
999 _c270724
_d270724
040 _aAR-ReUNN
_bspa
_cAR-ReUNN
_eaacr2